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2025-12-05iSTART-TEK Wins “Best EDA of the Year” at the 2025 EE Awards Asia
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2025-10-31SDMicro Adopts iSTART-TEK’s START™ to Successfully Achieve Mass Production of 28nm Display Controller ICs
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2025-10-15iSTART-TEK Successfully Assists a Leading Chip Design Company to Realize 55nm eFlash Chip Design Verification and Mass Production
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2025-10-14iSTART-TEK and a Leading Domestic Memory Manufacturer Successfully Verified MTP BIST IP
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2025-09-23iSTART-TEK EDA Products Fully Support IEEE 1838, Pioneering Innovation in 3D IC Memory Testing
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2025-09-18iSTART-TEK Unveils Industry-First AI-Powered MBIST Algorithm Recommendation Tool
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2025-09-10iSTART-TEK Completes FMEDA Analysis to Help Customers Build ISO 26262-Compliant Automotive ICs
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2025-07-01iSTART-TEK Obtained U.S. Patent, “Configurable Testing and Repair System for Non-Volatile Memory”!
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2025-06-30eFlash IP in Action: Enabling Faster, Safer Automotive SoC Production
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2025-06-23Why can’t traditional memory testing keep up with AI chips?
Events
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2025-07-22ICCAD-Expo 2025｜Cheng-yu IC 2025 Annual Developemt Forum& the 31th IC Design Industry Expo
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2025-01-20Webinar｜iSTART-TEK’s APPA
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2025-01-07Webinar｜START™ v5 Supports the BIST of CIM
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2025-01-06Webinar｜How to Integrate iSTART-TEK’s EDA Tools with Other EDA Tools to Complete the DFT Flows
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2024-12-30Webinar｜How to Control DPPM Through EZ-BIST