Sunrise Display Micro. (Suzhou) Co., Ltd. (SDMicro) has officially launched mass production of its latest 28nm display controller ICs, adopting iSTART-TEK’s independently developed START™ v5 memory test and repair platform to ensure high reliability and yield during the production stage.
SDMicro, a display driver IC design company with proprietary intellectual property, focuses on the development of AMOLED display driver chips for popular applications such as smartphones and wearable devices.
In this project, SDMicro implemented several core features of the START™ v5 platform, including MBIST (Memory Built-In Self-Test), MBISR (Memory Built-In Self-Repair), UDA (User Defined Algorithm), and TEC (Test Element Change). By integrating customized SRAM test and repair designs, the team effectively enhanced memory test coverage and overall yield performance.
In display controller IC development, memory testing plays a critical role in determining product yield and stability. iSTART-TEK’s START™ platform provides highly stable and comprehensive test coverage, enabling SDMicro to successfully complete mass production and achieve its targeted quality objectives.
START™ v5 features a high-coverage memory test algorithm and a scalable repair architecture. The platform supports several key technologies, including:
- MBIST + MBISR – Rapidly locate and repair on-chip SRAM defects to significantly improve production yield.
- TEC – Coordinates the test control unit with external test interfaces, simplifying the mass production testing process.
- UDA – Enables customized test flows for various memory architectures, ensuring high coverage and low DPPM performance.
iSTART-TEK stated that SDMicro’s successful mass production case demonstrates the proven effectiveness of the START™ platform in the display controller IC domain. Moving forward, the company will continue to drive broader collaboration to help customers achieve reliable high-volume production — with royalty contributions expected to begin next year.
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