In IC testing, time equals cost. Traditional SRAM test algorithms often test all memories equally, wasting valuable time and resources.
EZ-TEC (Easy Test Element Change) from iSTART-TEK introduces a modular approach to test algorithm design. Engineers can flexibly combine test elements to focus on critical or large-area SRAMs, achieving higher efficiency and better defect coverage.
EZ-TEC can be seamlessly integrated into existing BIST architectures or third-party MBIST solutions, allowing optimization even during CP stage — improving yield and reducing DPPM.