To support high bandwidth and low latency, networking chips often embed large, multi-block SRAM for critical functions such as switch buffers, packet scheduling tables, and flow entry tables. However, these memories are highly susceptible to process variation. Even if one memory block fails, overall chip yield may remain high. That’s where BIST (Built-In Self-Test) and BISR (Built-In Self-Repair) come in—enabling quick fault detection and repair through spare rows, columns, or blocks, without scrapping the entire chip.
In this video, we’ll cover:
- Real-world use cases in Wi-Fi 7 SoCs, Switch ICs, SerDes/PCIe PHY, and 5G Modems
- How BIST ensures coverage while BISR isolates and repairs defective memory cells
- Additional modules such as Logic BIST and On-chip Repair Analyzer for unified test & repair flow
- How these solutions improve yield, reliability, and DPPM while supporting long-term operation
With BIST and BISR working hand-in-hand—plus support for OTA, Field Repair, and Post-Silicon Repair—Networking ASICs can achieve carrier-grade reliability, maintain throughput in real-world conditions, and extend product lifetime.