In automotive chip design, embedded Flash (eFlash) testing and repair directly impact product reliability and safety. iSTART-TEK’s eFlash BIST IP not only covers comprehensive process test requirements, but also supports repair mechanisms to ensure consistent performance under stringent conditions.
Notably, this IP is certified to ISO 26262 functional safety standards, making it highly suitable for automotive-grade chips. It helps customers accelerate development while reducing DPPM risks.