Although Bluetooth chips are small and low-power, they integrate multiple SRAM blocks that store packets, communication buffers, and control information. The stability of these SRAMs directly affects the chip’s communication quality and overall system functionality. The main reasons why SRAM testing is important include:
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Embedded SRAM is a critical component
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Yield verification is required during package testing
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Sensitive to power and process variations
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SRAM is located in low-power islands
iSTART-TEK’s SRAM Testing Solution for BLE Chips
To address these challenges, iSTART-TEK has developed testing and repair strategies specifically for low-power Bluetooth chips:
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Retention-aware March algorithms
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Pattern Generator + Fault Simulator
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Built-in Repair Logic
Application Scenarios
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Wearable devices (e.g., smart bands): High demands due to space constraints and high integration; even minor failures pose risks.
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Automotive Bluetooth modules: Must comply with AEC-Q100, with clear requirements for SRAM testing and reliability.
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IoT sensors: Long operating times and low-power requirements make Retention Fault detection especially critical.
Although BLE chips are small, their SRAM stability requirements are very high. Introducing advanced testing and repair mechanisms from the design stage not only improves yield but also enhances the end product’s user experience and reliability.