Not used

Repair

  • It also supports various NVM controllers, allowing customers to directly utilize Hard-Repair.

POT (Power_On Test)

  • Enable POT with the following methods
    • ROM
    • RTL
    • Basic (Enable signal)
    • CPU
  • MSW (Memory Status Watch-Dog) is used to identify information of faulty memories in the POT mode
  • ARF (Automatic Repairing Flow) is used to repair failing memory automatically in the POT mode
  • CSV (Circuit Self-Verification) is used to guarantees the correctness of BIST circuits
  • ARS (Accumulative Repairing Solutions) is used to repair failing memories while new defects occur during the in-field stage

UDA (User Defined Algorithm)

  • UDA makes all of memory testing algorithms consist of Element.

ECC (Error-Correcting-Code)

  • Used to correct one-bit error of memory in the function mode

TEC (Testing Elements Change)

  • TEC is used to change testing elements based on selected testing elements after CP stages

BIST (CP Stages) + ECC (Function Mode)

  • After CP stages, users can know which memory has one-bit error, and then users can use ECC to correct this memory instance runtime